期刊
OPTICS COMMUNICATIONS
卷 282, 期 18, 页码 3657-3664出版社
ELSEVIER
DOI: 10.1016/j.optcom.2009.06.025
关键词
Point spread function engineering; Fluorescence microscopy; Image formation
类别
The resolution of fluorescence microscopes is limited by diffraction, which determines the extension of their point spread functions. We propose and study numerically a simple method, based on a combination of subtraction microscopy with regular and annular excitation beams, which permits to double the resolution compared to wide field microscopy. When combined with the fluorescence saturation phenomenon, this approach would be able to deliver a resolution of a few tens of nanometers. (c) 2009 Elsevier B.V. All rights reserved.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据