4.7 Article

Development and construction of rotating polarizer analyzer ellipsometer

期刊

OPTICS AND LASERS IN ENGINEERING
卷 49, 期 4, 页码 507-513

出版社

ELSEVIER SCI LTD
DOI: 10.1016/j.optlaseng.2011.01.005

关键词

Ellipsometry; Rotating polarizer analyzer ellipsometer; Optical properties of Au; ZnSe; SiO2

类别

向作者/读者索取更多资源

A detailed mathematical derivation and an experimental characterization of one to two ratio rotating polarizer analyzer ellipsometer (RPAE) are presented. The alignment, calibration, and testing of reference samples are also discussed. The optical properties of some known materials obtained by the proposed ellipsometer will be shown and compared to accepted values. Moreover, the constructed ellipsometer will be tested using two ellipsometry standards with different thicknesses. (C) 2011 Elsevier Ltd. All rights reserved.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.7
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据