4.6 Article

Antireflective characteristics of Ge1-xCx films on sub-wavelength structured ZnS surfaces

期刊

OPTICAL MATERIALS
卷 34, 期 1, 页码 244-247

出版社

ELSEVIER SCIENCE BV
DOI: 10.1016/j.optmat.2011.08.017

关键词

Antireflective characteristics; Ge1-xCx thin film; Sub-wavelength structures; ZnS

资金

  1. Aviation Science Fund [2008ZE53043]
  2. state key laboratory of solidification processing (NWPU) [58-TZ-2011]

向作者/读者索取更多资源

Antireflective sub-wavelength structures (SWSs) combined a Ge1-xCx coating on Zinc sulfide (ZnS) can enhance the long-wave infrared transmission and durability of ZnS, which have the potent for practical applications. We have investigated the antireflective characteristics of Ge1-xCx sub-wavelength periodic hole structures on ZnS through the Fourier modal method (FMM) for application with normally incident, randomly polarized, 10.6 mu m wavelength. Then according to the results, we have successfully fabricated the sub-wavelength periodic square hole structures with Ge0.05C0.95 films on one side of ZnS. A substantial transmittance improvement for bare ZnS in the 8-12 mu m spectral region was obtained. (C) 2011 Elsevier B.V. All rights reserved.

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