期刊
OPTICAL ENGINEERING
卷 53, 期 11, 页码 -出版社
SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS
DOI: 10.1117/1.OE.53.11.112307
关键词
digital holographic microscopy; total aberrations compensation; telecentric arrangement; misalignment; Zernike surface fitting
类别
The telecentric arrangement in digital holographic microscopy (DHM), considered to be a pure-physical compensation for defocus aberration introduced by microscope objective (MO), shows shift-invariant behavior. Its optical arrangement requires precise adjustment of the distance between MO aperture stop and collimated lens. However, it is difficult to measure and quantify the distance even by monitoring the spatial frequency spectrum of recorded hologram in the absence of object. Thus the misalignment results in the residual defocus aberration in the telecentric arrangement. The total aberrations compensation for misalignment of telecentric arrangement in DHM is presented, in which a posteriori surface fitting method based on Zernike polynomials is performed to eliminate the residual defocus aberration as well as other primary aberrations. The approach reduces the difficulty in precise alignment of the telecentric arrangement and decreases the measurement error caused by aberrations in construction. Three-dimensional retrieval of the height for micro-hole arrays with high-spatial-frequency content demonstrates the feasibility of the method. (C) 2014 Society of Photo-Optical Instrumentation Engineers (SPIE)
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