期刊
出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.nimb.2013.09.039
关键词
Transition metal ceramics; Helium mobility; Ion implantation; Nuclear reaction analysis; Thermal annealing; Blister formation
The techniques of ion implantation and nuclear reaction depth profiling are used to measure helium migration parameters under thermal ageing in advanced nuclear ceramics such as TiC, ZrC and TiN. Helium release measurements and activation energy calculations have been carried out in the temperature range of 1000-1600 degrees C for time periods of 2 h. Activation energy values are obtained in the range 0.7-1.2 eV. Due to rare availability of stoichiometric samples, the trapping of He in native vacancies seems to affect the mobility of He. Blisters are observed only at the surface of ZrC on thermal annealing. Crown Copyright (C) 2014 Published by Elsevier B.V. All rights reserved.
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