期刊
出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.nimb.2014.08.009
关键词
Positron annihilation; Positronium; Lifetime; Free-volume void; Chalcogenide vitreous semiconductors
A newly modified correlation equation between defect-related positron lifetime determined within two-state trapping model and radius of corresponding free-volume-type defects was proposed to describe compositional variations in atomic-deficient structure of covalent-bonded chalcogenides like binary As-S/Se glasses. Specific chemical environment of free-volume voids around neighboring network-forming polyhedrons was shown to play a decisive role in this correlation, leading to systematically enhanced volumes in comparison with typical molecular substrates, such as polymers. (C) 2014 Elsevier B.V. All rights reserved.
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