期刊
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
卷 269, 期 15, 页码 1767-1770出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.nimb.2011.04.114
关键词
Surface density measurement; Characteristic radiation
Simple and efficient method for precise surface density measurement in the range of about few mg/cm(2) for layers consisting of heavy elements, based on photon induced X-ray emission has been developed. The method has been applied to analyze Mott-scattering targets used in the measurement of the transverse electron polarization of electrons emitted in the neutron beta decay. The achieved relative accuracy is 1%. The absolute calibration accuracy of 2.3% was achieved with the atomic absorption spectroscopy. (C) 201 1 Elsevier B.V. All rights reserved.
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