Morphological evolution of films composed of energetic and size-selected silver nanocluster ions

In this study, morphologies of as-deposited and rapid thermal annealed films of silver nanoclusters are studied using scanning electron microscope (SEM) and atomic force microscope (AFM). Size-selected silver nanoclusters, containing 5000 atoms in a cluster, produced by the gas condensation method are deposited on Si substrate for a period of 8 min. In order to get an idea about the melting of clusters, the film is treated by rapid thermal annealing at 200 and 400 degrees C. The remarkable changes of morphology due to annealing signify a lowering of melting temperature of silver in the form of nanoscale particles. (C) 2009 Elsevier B.V. All rights reserved.