The micro-imaging station of the TopoTomo beamline at the ANKA synchrotron light source

The TopoTomo bending magnet beamline at the ANKA synchrotron facility in Karlsruhe (Germany) operates in the hard X-ray regime (above 6 keV). Recently, an X-ray micro-imaging station has been installed at TopoTomo. For typical imaging applications, a filtered white beam or from 2009 on a double-multilayer monochromator is used. In order to optimize the field of view and the resolution of the available indirect pixel detectors, different optical systems have been installed, adapted, respectively, to a large field of view (macroscope) and to high spatial resolution (microscope). They can be combined with different camera systems, ranging from 14-bit dynamic range CCDs to fast CMOS cameras. The spatial resolution can be brought substantially beyond the micrometer limit by using a Bragg magnifier. Due to the moderate flux of the beamline compared to insertion-device beamlines on third generation light sources, special emphasis has been put on the efficiency of the detectors via a dedicated scintillator concept. The layout of the beamline optics makes optimal use of the coherence properties. Thus, absorption contrast, phase-contrast and analyzer-based imaging can be applied. Additionally, white beam synchrotron topography is performed, using digital indirect X-ray pixel detectors as well as X-ray film. (C) 2009 Elsevier B.V. All rights reserved.