期刊
出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.nima.2011.09.031
关键词
Amorphous; X-ray diffraction; Area detector; Corrections
类别
资金
- US DOE Argonne National Laboratory [DE-AC02-06CH11357, DE-FG02-09ER46650]
Correction procedures for obtaining accurate X-ray structure factors from large area detectors are considered, including subpanel effects, over excited pixels and careful intensity corrections. Problems associated with data normalization, the use of a pixel response correction from a glass standard and minimization of systematic errors are also discussed. Data from glassy GeSe2 and liquid water measured with a Perkin Elmer amorphous-Silicon detector are used to demonstrate the effectiveness of these correction procedures. This requires reduction of systematic errors in the measured intensity to around the 0.1% level. Published by Elsevier B.V.
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