4.4 Article Proceedings Paper

Performance of focusing mirror device in EUV beamline of SPring-8 Compact SASE Source (SCSS)

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ELSEVIER SCIENCE BV
DOI: 10.1016/j.nima.2010.11.174

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EUV; Ablation; X-ray free electron laser; X-ray mirror; Beamline; Beam size; SPring-8

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A focusing mirror device was designed and installed in an extreme ultraviolet (EUV) beamline of the SPring-8 Compact SASE Source (SCSS). The horizontal and vertical sizes of the beam at the focal point were measured to be 22 and 26 pm with a working distance of 0.94 m at a wavelength of 60 nm. A high power density over 20 TW/cm(2) was achieved. Ablation properties of some materials such as silicon, diamond and tantalum have been studied for determining the focused beam profile with a single shot irradiation. (C) 2010 Elsevier B.V. All rights reserved.

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