4.4 Article

System-level simulation of a X-ray imager with nonlinear gain and per-pixel digitizer: XPCS case study

出版社

ELSEVIER SCIENCE BV
DOI: 10.1016/j.nima.2009.11.056

关键词

Pixel detector; DEPFET; Noise; Gain and offset error; Analog-to-digital converter; XPCS; XFEL

资金

  1. DESY
  2. European XFEL

向作者/读者索取更多资源

A system-level model of a low-noise high-speed mega-pixel camera with gain compression for X-ray photon correlation spectroscopy experiments at the European XFEL is presented. The model comprises the full signal chain from the sensor element via amplifier/filter and digitizer to the memory. The influence of gain- and offset errors as well as noise on the experiment-relevant image fidelity and intensity correlation function is discussed and compensation techniques are developed. A case study demonstrates the achievable efficiency of the chosen system parameters. (C) 2009 Elsevier B.V. All rights reserved.

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