4.4 Article Proceedings Paper

Elemental X-ray imaging using the Maia detector array: The benefits and challenges of large solid-angle

出版社

ELSEVIER SCIENCE BV
DOI: 10.1016/j.nima.2009.11.035

关键词

SXRF; PIXE; Dynamic analysis; X-ray microprobe; Silicon detector; Trace element imaging; Fundamental parameter method

向作者/读者索取更多资源

The fundamental parameter method for quantitative SXRF and PIXE analysis and imaging using the dynamic analysis method is extended to model the changing X-ray yields and detector sensitivity with angle across large detector arrays. The method is implemented in the GeoPIXE software and applied to cope with the large solid-angle of the new Maia 384 detector array and its 96 detector prototype developed by CSIRO and BNL for SXRF imaging applications at the Australian and NSLS synchrotrons. Peak-to-background is controlled by mitigating charge-sharing between detectors through careful optimization of a patterned molybdenum absorber mask. A geological application demonstrates the capability of the method to produce high definition elemental images up to similar to 100 M pixels in size. (C) 2009 EURATOM. Published by Elsevier B.V. All rights reserved.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.4
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据