期刊
出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.nima.2009.11.035
关键词
SXRF; PIXE; Dynamic analysis; X-ray microprobe; Silicon detector; Trace element imaging; Fundamental parameter method
The fundamental parameter method for quantitative SXRF and PIXE analysis and imaging using the dynamic analysis method is extended to model the changing X-ray yields and detector sensitivity with angle across large detector arrays. The method is implemented in the GeoPIXE software and applied to cope with the large solid-angle of the new Maia 384 detector array and its 96 detector prototype developed by CSIRO and BNL for SXRF imaging applications at the Australian and NSLS synchrotrons. Peak-to-background is controlled by mitigating charge-sharing between detectors through careful optimization of a patterned molybdenum absorber mask. A geological application demonstrates the capability of the method to produce high definition elemental images up to similar to 100 M pixels in size. (C) 2009 EURATOM. Published by Elsevier B.V. All rights reserved.
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