期刊
出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.nima.2009.06.035
关键词
X-ray fluorescence; Soft X-ray microscopy; Carbon edge
类别
资金
- INFN, Milano, Italy
Novel low-energy X-ray fluorescence (LEXRF) system based on a multiple Si drift detector (SDD) configuration has been developed and implemented in the European TwinMic X-ray microspectroscopy station operating at the Italian synchrotron radiation facility ELETTRA. The setup, hosting up to eight large-area SDDs with specially adapted readout electronics, has demonstrated excellent performance for elemental analysis in the 280-2200eV photon energy range, which covers the K and L edges of light elements, starting from C. The great advantage is the simultaneous acquisition of LEXRF, absorption and phase contrast maps, providing complementary information on elemental composition and morphology of specimen at submicrometer length scales. (C) 2009 Elsevier B.V. All rights reserved.
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