Synchrotron-based photoelectron microscopy

The paper is a brief overview of the operation principles and the potentials of the scanning photorelectron microscopes (SPEM) and X-ray photoemission electron microscopes (XPEEM) operating at synchrotron facilities. Selected results will illustrate the impact of high spatial resolution for microcharacterization of the surface composition and electronic structure, a key issue for analysis of technologically relevant materials and for fundamental understanding of many unexplored surface phenomena. (C) 2009 Elsevier B.V. All rights reserved.