Hydrogenic retention in irradiated tungsten exposed to high-flux plasma

Two sets of identical tungsten (W) targets are irradiated at 300K with 12.3MeV W(4+) ions to peak damage levels ranging from 0.5 to 10 displacements per atom (dpa). This results in a damage profile that is peaked at similar to 0.8 mu m and extends to a depth of similar to 1.5 mu m. Both sets of targets are exposed to high-density (n(e,center) = 3 x 10(20) m(-3)), low-temperature (T(e,center) = 1.6 eV) deuterium (D) plasma in Pilot-PSI. One set of irradiated targets is exposed at high surface temperatures (T(W) = 950-680 K) and the other at low surface temperatures (T(W) = 480-340 K). The surface temperature is determined by the local plasma conditions. Nuclear reaction analysis (NRA) is used to determine the D depth profiles at specific radial locations, thus giving a surface temperature scan of the D retention in the damaged W. Global retention is determined by thermal desorption spectroscopy, which yields total D retained in the target and also gives information of the different types of lattice defects that are trapping the D in the W lattice. The main results are that there is no measurable difference between the different dpa levels, implying a saturation of the retention enhancement at a level <= 0.5 dpa. For both irradiated and unirradiated tungsten, a peak in the retention is seen at T(W) = 480 K; however, the W(4+) irradiation clearly enhances the retention. This enhancement is also temperature dependent and increases with increasing surface temperature up to an enhancement by a factor of 15-23 at T(W) = 950 K. At the lowest surface temperatures, a fluence dependence appears since the implanted deuterium is diffusion limited to only a small fraction of the irradiated zone. TDS spectra show an enhancement of both low-energy trap sites and high-energy trap sites. For these conditions, diffusion-limited, low fill fraction trapping determines the hydrogenic retention of the W.