期刊
SURFACE AND INTERFACE ANALYSIS
卷 47, 期 11, 页码 1051-1055出版社
WILEY
DOI: 10.1002/sia.5812
关键词
Au-400 SIMS; cluster SIMS; event-by-event bombardment; detection; diblock brush terpolymers; self-assembly; nanodomain
资金
- National Science Foundation [CHE-1308312, DMR-1105304]
- Dow Chemical Company
- Welch Foundation [A-0001]
- Direct For Mathematical & Physical Scien
- Division Of Chemistry [1308312] Funding Source: National Science Foundation
- Division Of Materials Research
- Direct For Mathematical & Physical Scien [1105304] Funding Source: National Science Foundation
We present the application of cluster-SIMS for the analysis of the nanoscopic surface of diblock brush terpolymers (DBTs). This novel SIMS technique differs from conventional SIMS. It uses Au-400(4+) projectiles at 520keV and an event-by-event bombardment/detection regime for the analysis of co-localized molecular species. The performance of this SIMS method was tested on bottle brush' block molecules featuring a vertical aligned backbone structure. We were able to assess the extent of secondary ion emissions from the surface and analyze the degree of ordered alignment for DBTs by the fluorocarbon surface coverage. We demonstrate the feasibility of characterizing the homogeneity of macromolecular films at the nanoscale. Copyright (c) 2015 John Wiley & Sons, Ltd.
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