期刊
NANOTECHNOLOGY
卷 29, 期 44, 页码 -出版社
IOP Publishing Ltd
DOI: 10.1088/1361-6528/aad873
关键词
Kelvin probe force microscopy; organic inorganic hybrid perovskite; surface photovoltage; time resolved; big data
资金
- Center for Nanophase Materials Sciences
- Air Force Office of Scientific Research (AFOSR) [FA 9550-15-1-0064]
- AOARD [FA2386-15-1-4104]
- National Science Foundation [CBET-1438181]
Optoelectronic behavior in materials such as organic/inorganic hybrid perovskites depend on a complex interplay between fast (electronic) and slower (ionic) processes. These processes are thought to be influenced by structural inhomogeneities (e.g. interfaces and grain boundaries) bringing forward the necessity for development of techniques capable of correlating nanostructure and photo-transport behavior. While Kelvin probe force microscopy (KPFM) is ideally suited to map surface potentials on relevant length scales, it lacks sufficient temporal resolution to extract the meaningful system dynamics. Here, we develop a time resolved surface photovoltage (SPV) measurement based on full information capture of the photodetector stream during open loop KPFM operation. G-Mode, or G-KPFM allows quantification of SPV with microsecond temporal and nanoscale spatial resolution. Using this technique, we observe concurrent spatial and fast temporal variations in the SPV generated across a methylammonium lead bromide (MAPbBr3) thin film, a possible indicator relating microstructure with heterogenous photo-transport behavior. We further demonstrate the advantage of adopting big data analytics including unsupervised clustering methods to quickly discern spatial variability in the information rich SPV dataset. Beyond G-KPFM, such clustering methods will be useful for interpretation of the multidimensional datasets arising from the growing number of time resolved KPFM approaches now available.
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