期刊
NANOTECHNOLOGY
卷 24, 期 22, 页码 -出版社
IOP PUBLISHING LTD
DOI: 10.1088/0957-4484/24/22/225204
关键词
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资金
- Swedish Research Council (VR)
We measured the exciton lifetime of single silicon quantum dots, fabricated by electron beam lithography, reactive ion etching and oxidation. The observed photoluminescence decays are of mono-exponential character with a large variation (5-45 mu s) from dot to dot, even for the same emission energy. We show that this lifetime variation may be the origin of the heavily debated non-exponential (stretched) decays typically observed for ensemble measurements.
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