期刊
NANOTECHNOLOGY
卷 21, 期 22, 页码 -出版社
IOP PUBLISHING LTD
DOI: 10.1088/0957-4484/21/22/225707
关键词
-
资金
- NSFC [50721091, 10874165, 90921013]
- MOST of China [2006CB922002]
- CAS
- China Postdoctoral Science Foundation [20090460737]
- Fundamental Research Funds for the Central Universities (FRFCU)
Vertically well-aligned ZnO nanorod arrays with three kinds of tip morphology-abruptly sharpened, tapered and plane-have been controllably fabricated with wafer size uniformity by vapor phase transport and condensation. Except that the tip morphology is distinctly different, all of these nanorods are single crystalline, growing along their wurtzite < 0001 > axis, with similar diameters, lengths and densities. The field emission properties of these nanorod arrays are comparatively investigated and are found to be strongly affected by the tip morphology. A nanorod with the abruptly sharpened tip possesses the lowest turn-on and threshold electric fields as well as the highest field enhancement factor. Further analysis reveals that the abruptly sharpened tip morphology can reduce the screening effect more efficiently than the others. These results are very helpful for the design, fabrication and optimization of integrated field emitters using 1D nanostructures as the cathode material.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据