4.8 Article

Large-scale parallel arrays of silicon nanowires via block copolymer directed self-assembly

相关参考文献

注意:仅列出部分参考文献,下载原文获取全部文献信息。
Review Materials Science, Multidisciplinary

Directed block copolymer self-assembly for nanoelectronics fabrication

Daniel J. C. Herr

JOURNAL OF MATERIALS RESEARCH (2011)

Article Chemistry, Multidisciplinary

Self-Aligned Memristor Cross-Point Arrays Fabricated with One Nanoimprint Lithography Step

Qiangfei Xia et al.

NANO LETTERS (2010)

Article Nanoscience & Nanotechnology

High-yield self-limiting single-nanowire assembly with dielectrophoresis

Erik M. Freer et al.

NATURE NANOTECHNOLOGY (2010)

Article Nanoscience & Nanotechnology

Nanowire transistors without junctions

Jean-Pierre Colinge et al.

NATURE NANOTECHNOLOGY (2010)

Article Engineering, Electrical & Electronic

Integration of block copolymer directed assembly with 193 immersion lithography

Chi-Chun Liu et al.

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B (2010)

Article Engineering, Electrical & Electronic

Fabrication and Characterization of Gate-All-Around Silicon Nanowires on Bulk Silicon

Vincent Pott et al.

IEEE TRANSACTIONS ON NANOTECHNOLOGY (2008)

Article Engineering, Electrical & Electronic

Using high-contrast salty development of hydrogen silsesquioxane for sub-10-nm half-pitch lithography

Joel K. W. Yang et al.

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B (2007)

Article Engineering, Electrical & Electronic

Nanowire fin field effect transistors via UV-based nanoimprint lithography

A. Fuchs et al.

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B (2006)

Article Chemistry, Multidisciplinary

Silicon p-FETs from ultrahigh density nanowire arrays

Dunwei Wang et al.

NANO LETTERS (2006)

Article Multidisciplinary Sciences

Bridging dimensions: Demultiplexing ultrahigh-density nanowire circuits

R Beckman et al.

SCIENCE (2005)

Article Engineering, Electrical & Electronic

Measuring the specific contact resistance of contacts to semiconductor nanowires

SE Mohney et al.

SOLID-STATE ELECTRONICS (2005)

Article Engineering, Manufacturing

TCAD-based statistical analysis and modeling of gate line-edge roughness effect on nanoscale MOS transistor performance and scaling

SD Kim et al.

IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING (2004)

Article Chemistry, Multidisciplinary

Controlled growth and structures of molecular-scale silicon nanowires

Y Wu et al.

NANO LETTERS (2004)

Article Multidisciplinary Sciences

Ultrahigh-density nanowire lattices and circuits

NA Melosh et al.

SCIENCE (2003)

Article Multidisciplinary Sciences

Logic gates and computation from assembled nanowire building blocks

Y Huang et al.

SCIENCE (2001)

Article Physics, Applied

Diameter-controlled synthesis of single-crystal silicon nanowires

Y Cui et al.

APPLIED PHYSICS LETTERS (2001)

Article Multidisciplinary Sciences

Directed assembly of one-dimensional nanostructures into functional networks

Y Huang et al.

SCIENCE (2001)

Letter Chemistry, Physical

Doping and electrical transport in silicon nanowires

Y Cui et al.

JOURNAL OF PHYSICAL CHEMISTRY B (2000)

Article Physics, Applied

Silicon nanowire devices

SW Chung et al.

APPLIED PHYSICS LETTERS (2000)

Article Multidisciplinary Sciences

Control of thickness and orientation of solution-grown silicon nanowires

JD Holmes et al.

SCIENCE (2000)