4.8 Article

Interfacial state induced ultrasensitive ultraviolet light photodetector with resolved flux down to 85 photons per second

期刊

NANO RESEARCH
卷 8, 期 4, 页码 1098-1107

出版社

TSINGHUA UNIV PRESS
DOI: 10.1007/s12274-014-0587-8

关键词

II-VI group; detectivity; Schottky barrier diode; optoelectronic device; interfacial states

资金

  1. National Basic Research Program of China [2013CB933900, 2014CB931800, 2010CB934700]
  2. Major Research Plan of the National Natural Science Foundation of China [91027021, 91233110]
  3. National High Technology Research and Development Program of China [2007AA03Z301]
  4. National Natural Science Foundation of China [91022032, 21101051, 61106010, 51172151, 91227103, 21431006]
  5. Natural Science Foundation of Anhui Province [J2014AKZR0059]

向作者/读者索取更多资源

We present an ultrasensitive ultraviolet (UV) detector based on a p-type ZnS nanoribbon (NR)/indium tin oxide (ITO) Schottky barrier diode (SBD). The device exhibits a pseudo-photovoltaic behavior which can allow the SBD to detect UV light irradiation with incident power of 6 x 10(-17) W (similar to 85 photons/s on the NR) at room temperature, with excellent reproducibility and stability. The corresponding detectivity and photoconductive gain are calculated to be 3.1 x 10(20) cm center dot Hz(1/2)center dot W-1 and 6.6 x 10(5), respectively. It is found that the presence of the trapping states at the p-ZnS NR/ITO interface plays a crucial role in determining the ultrahigh sensitivity of this nanoSBDs. Based on our theoretical calculation, even ultra-low photon fluxes on the order of several tens of photons could induce a significant change in interface potential and consequently cause a large photocurrent variation. The present study provides new opportunities for developing high-performance optoelectronic devices in the future.

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