期刊
NANO LETTERS
卷 14, 期 7, 页码 3840-3847出版社
AMER CHEMICAL SOC
DOI: 10.1021/nl500999r
关键词
Graphene; annealing; contact resistance; resist residues; soft shadow-mask; Raman analysis
类别
资金
- Faculty of Engineering, NUS [R-263-000-A76-750]
- National Research Foundation, Singapore [NRF2011NRF-CRP002-050]
Annealing is a postprocessing treatment commonly used to improve metal-graphene contacts with the assumption that resist residues sandwiched at the metal-graphene contacts are removed during annealing. Here, we examine this assumption by undertaking a systematic study to understand mechanisms that lead to the contact enhancement brought about by annealing. Using a soft shadow-mask, we fabricated residue-free metal-graphene contacts with the same dimensions as lithographically defined metal-graphene contacts on the same graphene flake. Both cases show comparable contact enhancement for nickel-graphene contacts after annealing treatment signifying that removal of resist residues is not the main factor for contact enhancement. It is found instead that carbon dissolves from graphene into the metal at chemisorbed Ni- and Co-graphene interfaces and leads to many end-contacts being formed between the metal and the dangling carbon bonds in the graphene, which contributes to much smaller contact resistance.
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