期刊
NANO LETTERS
卷 14, 期 4, 页码 1938-1943出版社
AMER CHEMICAL SOC
DOI: 10.1021/nl4047784
关键词
Graphene oxide; solid-state microcapacitors; laser reduction; diffusion-less; classical molecular dynamic method
类别
资金
- U.S. [NSF-0926093, NSF-1138182, NSF-1067960]
- State Key Laboratory of Solidification Processing (NWPU), China [83-TZ-2013]
- AFOSR [MURI-FA9550-12-1-0035]
- Div Of Civil, Mechanical, & Manufact Inn
- Directorate For Engineering [1067960] Funding Source: National Science Foundation
- Div Of Engineering Education and Centers
- Directorate For Engineering [1138182] Funding Source: National Science Foundation
Substantial differences in charge storage mechanisms exist between dielectric capacitors (DCs) and electrochemical capacitors (ECs), resulting in orders of magnitude difference of stored charge density in them. However, if ionic diffusion, the major charge transport mechanism in ECs, is confined within nanoscale dimensions, the Helmholtz layers and diffusion layers will overlap, resulting in dismissible ionic diffusion. An interesting contradiction between appreciable energy density and unrecognizable ionic diffusion is observed in solid-state capacitors made from reduced graphene oxide films that challenge the fundamental charge storage mechanisms proposed in such devices. A new capacitive model is proposed, which combines the two distinct charge storage mechanisms of DCs and ECs, to explain the contradiction, of high storage capacity yet undetectable ionic diffusion, seen in graphene oxide based supercapacitors.
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