4.8 Article

Large Thermoelectricity via Variable Range Hopping in Chemical Vapor Deposition Grown Single-Layer MoS2

期刊

NANO LETTERS
卷 14, 期 5, 页码 2730-2734

出版社

AMER CHEMICAL SOC
DOI: 10.1021/nl500666m

关键词

Thermopower; Molybdenum Disulfide; Chemical Vapor Deposition; Variable Range Hopping

资金

  1. NUS Young Investigator Award
  2. Singapore National Research Foundation Fellowship award [RF2008-07-R-144-000-245-281]
  3. NRF-CRP award [R-144-000-295-281]
  4. Singapore Millennium Foundation-NUS Research Horizons award [R-144-001-271-592, R-144-001-271-646]
  5. Singapore National Research Foundation under NRF Research Fellowship [NRF-NRFF2011-02, NRF-NRFF2012-01]
  6. National Research Foundation China [11304227]

向作者/读者索取更多资源

Ultrathin layers of semiconducting molybdenum disulfide (MoS2) offer significant prospects in future electronic and optoelectronic applications. Although an increasing number of experiments bring light into the electronic transport properties of these crystals, their thermoelectric properties are much less known. In particular, thermoelectricity in chemical vapor deposition grown MoS2, which is more practical for wafer-scale applications, still remains unexplored. Here, for the first time, we investigate these properties in grown single layer MoS2. Microfabricated heaters and thermometers are used to measure both electrical conductivity and thermopower. Large values of up to similar to 30 mV/K at room temperature are observed, which are much larger than those observed in other two-dimensional crystals and bulk MoS2. The thermopower is strongly dependent on temperature and applied gate voltage with a large enhancement at the vicinity of the conduction band edge. We also show that the Seebeck coefficient follows S similar to T-1/3, suggesting a two-dimensional variable range hopping mechanism in the system, which is consistent with electrical transport measurements. Our results help to understand the physics behind the electrical and thermal transports in MoS2 and the high thermopower value is of interest to future thermoelectronic research and application.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.8
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据