4.8 Article

Surface Reconstruction-Induced Coincidence Lattice Formation Between Two-Dimensionally Bonded Materials and a Three-Dimensionally Bonded Substrate

期刊

NANO LETTERS
卷 14, 期 6, 页码 3534-3538

出版社

AMER CHEMICAL SOC
DOI: 10.1021/nl5011492

关键词

Coincidence lattices; van der Waals epitaxy; 2D materials; topological insulators; phase change materials; surface reconstructions

资金

  1. EU within the FP7 project PASTRY [GA 317746]

向作者/读者索取更多资源

Sb2Te3 films are used for studying the epitaxial registry between two-dimensionally bonded (2D) materials and three-dimensional bonded (3D) substrates. In contrast to the growth of 3D materials, it is found that the formation of coincidence lattices between Sb2Te3 and Si(111) depends on the geometry and dangling bonds of the reconstructed substrate surface. Furthermore, we show that the epitaxial registry can be influenced by controlling the Si(111) surface reconstruction and confirm the results for ultrathin films.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.8
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据