4.8 Article

Observing Graphene Grow: Catalyst-Graphene Interactions during Scalable Graphene Growth on Polycrystalline Copper

期刊

NANO LETTERS
卷 13, 期 10, 页码 4769-4778

出版社

AMER CHEMICAL SOC
DOI: 10.1021/nl4023572

关键词

Graphene; chemical vapor deposition (CVD); polycrystalline copper (Cu); in situ X-ray photoelectron spectroscopy; in situ X-ray diffractometry; environmental scanning electron microscopy; intercalation

资金

  1. ERC [279342]
  2. EPSRC [EP/K016636/1]
  3. EU [285275]
  4. Cambridge Commonwealth Trust
  5. EPSRC
  6. Nano Science & Technology Doctoral Training Centre Cambridge (NanoDTC)
  7. [EP/H047565/1]
  8. EPSRC [EP/K016636/1, EP/H047565/1] Funding Source: UKRI
  9. Engineering and Physical Sciences Research Council [EP/K016636/1, EP/H047565/1] Funding Source: researchfish

向作者/读者索取更多资源

Complementary in situ X-ray photoelectron spectroscopy (XPS), X-ray diffractometry, and environmental scanning electron microscopy are used to fingerprint the entire graphene chemical vapor deposition process on technologically important polycrystalline Cu catalysts to address the current lack of understanding of the underlying fundamental growth mechanisms and catalyst interactions. Graphene forms directly on metallic Cu during the high-temperature hydrocarbon exposure, whereby an upshift in the binding energies of the corresponding C1s XPS core level signatures is indicative of coupling between the Cu catalyst and the growing graphene. Minor carbon uptake into Cu can under certain conditions manifest itself as carbon precipitation upon cooling. Postgrowth, ambient air exposure even at room temperature decouples the graphene from Cu by (reversible) oxygen intercalation. The importance of these dynamic interactions is discussed for graphene growth, processing, and device integration. KEYWORDS: Graphene, chemical vapor deposition (CVD), polycrystalline copper (Cu), in situ X-ray photoelectron spectroscopy, in situ X-ray diffractometry, environmental scanning electron microscopy, intercalation

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