期刊
NANO LETTERS
卷 13, 期 8, 页码 3455-3462出版社
AMER CHEMICAL SOC
DOI: 10.1021/nl400780d
关键词
SPM; ionic dynamics; Ca-BFO; voltage spectroscopy; oxygen vacancy; FORC-IV
类别
资金
- Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. Department of Energy
- National Science Council of Republic of China [NSC-101-2119-M-009-003-MY2]
- Ministry of Education [MOE-ATU 101W961]
- Center for Interdisciplinary Science at National Chiao Tung University
A scanning probe microscopy technique for probing local ionic dynamics in electrochemically active materials based on the first-order reversal curve current-voltage (FORC-IV) method is presented. FORC-IV imaging mode is applied to a Ca-substituted bismuth ferrite (Ca-BFO) system to separate the electronic and ionic phenomena in this material and visualize the spatial variability of these behaviors. The variable-temperature measurements further demonstrate the interplay between the thermally and electric-field-driven resistance changes in Ca-BFO. The FORC-IV is shown to be a simple, powerful, and flexible method for studying electrochemical activity of materials at the nanoscale and, in conjunction with the electrochemical strain microscopy, it can be used for differentiating ferroelectric and ionic behaviors.
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