期刊
NANO LETTERS
卷 12, 期 2, 页码 893-898出版社
AMER CHEMICAL SOC
DOI: 10.1021/nl203956q
关键词
Scanning probe microscopy; electrostatic force microscopy; organic solar cells; bulk heterojunction; P3HT:PCBM
类别
资金
- Center for Interface Science: Solar Electric Materials
- U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences [DE-SC0001084]
- Air Force Office of Sponsored Research
- NSF [DMR 0449422]
- NSF IGERT
- University of Washington
- Division Of Materials Research
- Direct For Mathematical & Physical Scien [1005504] Funding Source: National Science Foundation
We propose, simulate, and experimentally validate a new mechanical detection method to analyze atomic force microscopy (AFM) cantilever motion that enables noncontact discrimination of transient events with similar to 100 ns temporal resolution without the need for custom AFM probes, specialized instrumentation, or expensive add-on hardware. As an example application, we use the method to screen thermally annealed poly(3-hexylthiophene):phenyl-C-61-butyric acid methyl ester photovoltaic devices under realistic testing conditions over a technologically relevant performance window. We show that variations in device efficiency and nanoscale transient charging behavior are correlated, thereby linking local dynamics with device behavior. We anticipate that this method will find application in scanning probe experiments of dynamic local mechanical, electronic, magnetic, and biophysical phenomena.
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