期刊
NANO LETTERS
卷 12, 期 7, 页码 3448-3454出版社
AMER CHEMICAL SOC
DOI: 10.1021/nl300751q
关键词
Nanocrystalline metals; grain boundary diffusion; triple junction transport; grain boundary width; atom probe tomography; CuNi
类别
资金
- German Academic Exchange Service (DAAD)
- Deutsche Forschungsgemeinschaft [DFG: SCHM 1182/7-1, SCHM 1182/9-1, SCHM 1182/9-2]
Triple junctions (TJ), singular topological defects of the grain boundary (GB) structure, get a dominant role for grain growth and atomic transport in nanocrystalline matter. Here, we present detailed measurements by atom probe tomography, even of the temperature dependence of TJ transport of Ni in nanocrystalline Cu in the chemical regime of interdiffusion. An unexpected variation of the effective width of merging GBs with temperature is detected. It is demonstrated that proper measurement of TJ transport requires taking into account this remarkable effect. TJ diffusion is found to be a factor of about 200 faster than GB diffusion. Its activation energy amounts to only two-thirds of that of the GB.
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