4.8 Article

Local Voltage Drop in a Single Functionalized Graphene Sheet Characterized by Kelvin Probe Force Microscopy

期刊

NANO LETTERS
卷 11, 期 9, 页码 3543-3549

出版社

AMER CHEMICAL SOC
DOI: 10.1021/nl201070c

关键词

Functionalized graphene; Kelvin probe force microscopy; electrical conductivity; contact resistance; sheet resistance

资金

  1. Army Research Office (ARO)/Multidisciplinary Research Initiative (MURI) [W911NF-09-1-476]
  2. Pacific Northwest National Laboratory [66354]
  3. Alexander von Humboldt Foundation

向作者/读者索取更多资源

We studied the local voltage drop in functionalized graphene sheets of sub mu m size under external bias conditions by Kelvin probe force microscopy. Using this noninvasive experimental approach, we measured ohmic current-voltage characteristics and an intrinsic conductivity of about 3.7 x 10(5) S/m corresponding to a sheet resistance of 2.7 k Omega/sq under ambient conditions for graphene produced via thermal reduction of graphite oxide. The contact resistivity between functionalized graphene and metal electrode was found. to be <6.3 x 10(-7) Omega cm(2).

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.8
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据