期刊
NANO LETTERS
卷 11, 期 9, 页码 3768-3773出版社
AMER CHEMICAL SOC
DOI: 10.1021/nl2018178
关键词
Molybdenum disulfide (MoS2); layered materials; field-effect transistor; quantum transport; NEGF; device physics
类别
资金
- University of California
Monolayer molybdenum disulfide (MoS2), unlike its bulk form, is a direct band gap semiconductor with a band gap of 1.8 eV. Recently, field-effect transistors have been demonstrated experimentally using a mechanically exfoliated MoS2 monolayer, showing promising potential for next generation electronics. Here we project the ultimate performance limit of MoS2 transistors by using nonequilibrium Green's function based quantum transport simulations. Our simulation results show that the strength of MoS2 transistors lies in large ON-OFF current ratio (>10(10)), immunity to short channel effects (drain-induced barrier lowering similar to 10 mV/V), and abrupt switching (subthreshold swing as low as 60 mV/decade). Our comparison of monolayer MoS2 transistors to the state-of-the-art III-V materials based transistors, reveals that while MoS2 transistors may not be ideal for high-performance applications due to heavier electron effective mass (m* = 0.45m(0)) and a lower mobility, they can be an attractive alternative for low power applications thanks to the large band gap and the excellent electrostatic integrity inherent in a two-dimensional system.
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