期刊
NANO LETTERS
卷 11, 期 1, 页码 125-131出版社
AMER CHEMICAL SOC
DOI: 10.1021/nl103003d
关键词
Seebeck coefficient; conductive polymer; lithography; electropolymerization; nanopatterning
类别
资金
- National Science Foundation [DMR-0654055]
- American Chemical Society [46815-AC 10]
- UCI School of Physical Sciences Center for Solar Energy
The Seebeck coefficient, S, and the electrical conductivity, sigma, of electrodeposited poly(3,4-ethylenedioxythiophene) (PEDOT) nanowires and thin films are reported. PEDOT nanowires were prepared by electropolymerizing 3,4-ethylenedioxythiophene (EDOT) in aqueous LiClO4 within a template prepared using the lithographically patterned nanowire electrodeposition (LPNE) process. These nanowires were 40-90 rim in thickness, 150-580 nm in width, and 200 mu m in length. sigma and S were measured from 190 K to 310 K by fabricating heaters and thermocouples on top of arrays of 750 PEDOT nanowires. Such PEDOT nanowire arrays consistently produced S values that were higher than those for PEDOT films: up to -122 mu V/K (310 K) for nanowires and up to -57 mu V/K (310 K) for films. The sample-to-sample variation in S for 14 samples of PEDOT nanowires and films, across a wide range of critical dimensions, is fully explained by variations in the carrier concentrations in accordance with the Mott equation. In spite of their higher vertical bar S vertical bar values, PEDOT nanowires also had higher sigma than films, on average, because electron mobilities were greater in nanowires by a factor of 3.
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