期刊
NANO LETTERS
卷 9, 期 1, 页码 102-106出版社
AMER CHEMICAL SOC
DOI: 10.1021/nl8025949
关键词
-
类别
资金
- Engineering and Physical Sciences Research Council (EPSRC) [GR/S82176/01]
- EPSRC [GR/S15808/01]
- Engineering and Physical Sciences Research Council [GR/S82176/01, GR/S15808/01] Funding Source: researchfish
Few layer graphene nanostructures are directly imaged using aberration corrected high-resolution transmission electron microscopy with an electron accelerating voltage of 80 kV. We observe rotational stacking faults in the HRTEM images of 2-6 layers of graphene sheets, giving rise to Moire patterns. By filtering in the frequency domain using a Fourier transform, we reconstruct the graphene lattice of each sheet and determine the packing structure and relative orientations of up to six separate sets. Direct evidence is obtained for few layer graphene sheets with packing that is different to the standard AB Bernal packing of bulk graphite. This has implications toward bilayer and few layer graphene electronic devices and the determination of their intrinsic structure.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据