期刊
MRS BULLETIN
卷 34, 期 9, 页码 648-657出版社
SPRINGER HEIDELBERG
DOI: 10.1557/mrs2009.176
关键词
-
资金
- Scientific User Facilities
- DOE
- BES
- Fundacao para a Ciencia e a Technologia [PTDC/FIS/81442/2006, PTDC/CTM 73030/2006]
- Fundação para a Ciência e a Tecnologia [PTDC/FIS/81442/2006] Funding Source: FCT
Piezoresponse force microscopy (PFM) is a powerful method widely used for nanoscale studies of the electromechanical coupling effect in various materials systems. Here, we review recent progress in this field that demonstrates great potential of PFM for the investigation of static and dynamic properties of ferroelectric domains, nanofabrication and lithography, local functional control, and structural imaging in a variety of inorganic and organic materials, including piezoelectrics, semiconductors, polymers, biomolecules, and biological systems. Future pathways for PFM application in high-density data storage, nanofabrication, and spectroscopy are discussed.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据