Analysis of complex microstructures: Serial sectioning and phase-field simulations

With the emergence and evolution of serial sectioning techniques that allow for three-dimensional data collection and the continuing increase in computational power, it is now possible to analyze and compute the evolution of three-dimensional nano- and microstructures. Structures can be accurately characterized, and it is possible to correlate processing paths with materials properties with great precision. Examples of the analysis and computations of the evolution of three-dimensional microstructures are discussed. The focus is on experiments that use serial sectioning methods to determine three-dimensional structure and on phase-field simulations of microstructural evolution that employ experimental three-dimensional data as initial conditions.