期刊
SCRIPTA MATERIALIA
卷 104, 期 -, 页码 83-86出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.scriptamat.2015.03.028
关键词
Solar cells; Cu(In,Ga)Se-2; Atom probe tomography; Sodium
Atom probe tomography (APT) has been used to study the distribution of Na atoms in polycrystalline Cu(In,Ga)Se-2 (CIGSe) thin films. APT, which allows separate investigations of grain boundaries and grain interiors chemistry, shows the presence of inter- and intra-granular Na segregations. It is highlighted that these segregations are found associated to Cu-depletion and In-enrichment. The segregation of Na to crystalline point defects and extended ones is finally discussed regarding its impact on the electrical properties of CIGSe layers. (C) 2015 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据