期刊
MINERALOGICAL MAGAZINE
卷 73, 期 4, 页码 633-643出版社
MINERALOGICAL SOC
DOI: 10.1180/minmag.2009.073.4.633
关键词
quartz; authigenic; hydrothermal; trace elements; SIMS; electron microprobe; cathodoluminescence; charge contrast
类别
Authigenic quartz overgrowths and hydrothermal quartz crystals from locations in Oman and Switzerland have been investigated with SIMS, EPMA, SEM-CL and SEM-CC. All techniques reveal similar zonation patterns with SEM-CL having the best resolution followed by SEM-CC, EPMA and finally SIMS. The observed zonations reflect chemical and/or physical changes during growth in the precipitation environment or disequilibrium precipitation at the crystal surface (i.e. sectoral and intrasectoral zonation). Based on the total Al content, two types of authigenic quartz are distinguishable. When the Al concentration is < 500 mu g g(-1), the predominant CL emission is at similar to 630 nm; in such quartzes, SEM-CL and SEM-CC are directly correlated, and signal intensities drop as a function of increasing Al concentration. In contrast, authigenic quartz with Al concentrations between 500 mu g g(-1) and 1000 mu g g(-1) has CL emission maxima at both similar to 630 nm and similar to 380-400 nm, at which point the panchromatic SEM-CL and SEM-CC intensities become decoupled.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据