4.5 Article

Mechanisms of radiation damage in beam-sensitive specimens, for TEM accelerating voltages between 10 and 300 kV

相关参考文献

注意:仅列出部分参考文献,下载原文获取全部文献信息。
Review Microscopy

Delocalized radiation damage in polymers

R. F. Egerton et al.

MICRON (2012)

Article Physics, Multidisciplinary

Accurate Measurement of Electron Beam Induced Displacement Cross Sections for Single-Layer Graphene

Jannik C. Meyer et al.

PHYSICAL REVIEW LETTERS (2012)

Article Microscopy

40 keV atomic resolution TEM

David C. Bell et al.

ULTRAMICROSCOPY (2012)

Article Microscopy

Transmission electron microscopy at 20 kV for imaging and spectroscopy

U. Kaiser et al.

ULTRAMICROSCOPY (2011)

Article Materials Science, Multidisciplinary

Electron knock-on damage in hexagonal boron nitride monolayers

J. Kotakoski et al.

PHYSICAL REVIEW B (2010)

Article Microscopy

Basic questions related to electron-induced sputtering in the TEM

R. F. Egerton et al.

ULTRAMICROSCOPY (2010)

Review Anatomy & Morphology

In Situ TEM of Radiation Effects in Complex Ceramics

Jie Lian et al.

MICROSCOPY RESEARCH AND TECHNIQUE (2009)

Article Materials Science, Multidisciplinary

Atomic-resolution imaging of lithium in Al3Li precipitates

M. D. Rossell et al.

PHYSICAL REVIEW B (2009)

Article Materials Science, Multidisciplinary

Electron knock-on cross section of carbon and boron nitride nanotubes

A. Zobelli et al.

PHYSICAL REVIEW B (2007)

Article Engineering, Electrical & Electronic

Energy deposition and transfer in electron-beam lithography

B Wu et al.

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B (2001)

Article Physics, Applied

Electron irradiation effects in single wall carbon nanotubes

BW Smith et al.

JOURNAL OF APPLIED PHYSICS (2001)