期刊
MICROSCOPY AND MICROANALYSIS
卷 19, 期 3, 页码 693-697出版社
CAMBRIDGE UNIV PRESS
DOI: 10.1017/S1431927613000445
关键词
twinning; thin films; transmission electron microscopy; electron diffraction; orientation mapping
资金
- Walloon Region through the First Postdoc programme
- Fonds National de La Recherche Scientifique
- Interuniversity Attraction Poles program of the Belgian State Federal Office for Scientific, Technical and Cultural Affairs [P7/21]
A new automated crystallographic orientation mapping tool in a transmission electron microscope technique, which is based on pattern matching between every acquired electron diffraction pattern and precalculated templates, has been used for the microstructural characterization of nondeformed and deformed aluminum thin films and twinning-induced plasticity steels. The increased spatial resolution and the use of electron diffraction patterns rather than Kikuchi lines make this tool very appropriate to characterize fine grained and deformed microstructures.
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