期刊
MICROSCOPY AND MICROANALYSIS
卷 19, 期 1, 页码 111-119出版社
CAMBRIDGE UNIV PRESS
DOI: 10.1017/S1431927612014055
关键词
stereology; orientation mapping; grain boundary character distribution; precession microscopy
资金
- SRC [Task 1292.008, 2121.001]
- MRSEC program of the National Science Foundation [DMR-0520425]
- ONR-MURI [N00014-11-1-0678]
Stereological analysis has been coupled with transmission electron microscope (TEM) orientation mapping to investigate the grain boundary character distribution in nanocrystalline copper thin films. The use of the nanosized (<5 nm) beam in the TEM for collecting spot diffraction patterns renders an order of magnitude improvement in spatial resolution compared to the analysis of electron backscatter diffraction patterns in the scanning electron microscope. Electron beam precession is used to reduce dynamical effects and increase the reliability of orientation solutions. The misorientation distribution function shows a strong misorientation texture with a peak at 60 degrees/[111], corresponding to the Sigma 3 misorientation. The grain boundary plane distribution shows {111} as the most frequently occurring plane, indicating a significant population of coherent twin boundaries. This study demonstrates the use of nanoscale orientation mapping in the TEM to quantify the five-parameter grain boundary distribution in nanocrystalline materials.
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