期刊
MICROSCOPY AND MICROANALYSIS
卷 17, 期 6, 页码 950-962出版社
CAMBRIDGE UNIV PRESS
DOI: 10.1017/S1431927611011895
关键词
atom probe tomography; precipitate analysis; Cu precipitation; M2C carbides
资金
- Office for Naval Research
- DARPA
- NSF-MRI [DMR-0420532]
- ONR-DURIP [N00014-0400798, N00014-0610539, NOOO14-0910781]
The differences in artifacts associated with voltage-pulsed and laser-pulsed (wavelength = 532 or 355 nm) atom-probe tomographic (APT) analyses of nanoscale precipitation in a high-strength low-carbon steel are assessed using a local-electrode atom-probe tomograph. It is found that the interfacial width of nanoscale Cu precipitates increases with increasing specimen apex temperatures induced by higher laser pulse energies (0.6-2 nJ pulse(-1) at a wavelength of 532 nm). This effect is probably due to surface diffusion of Cu atoms. Increasing the specimen apex temperature by using pulse energies up to 2 nJ pulse(-1) at a wavelength of 532 nm is also found to increase the severity of the local magnification effect for nanoscale M2C metal carbide precipitates, which is indicated by a decrease of the local atomic density inside the carbides from 68 +/- 6 nm(-3) (voltage pulsing) to as small as 3.5 +/- 0.8 nm(-3). Methods are proposed to solve these problems based on comparisons with the results obtained from voltage-pulsed APT experiments. Essentially, application of the Cu precipitate compositions and local atomic density of M2C metal carbide precipitates measured by voltage-pulsed APT to 532 or 355 nm wavelength laser-pulsed data permits correct quantification of precipitation.
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