期刊
MICRON
卷 40, 期 1, 页码 135-139出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.micron.2008.01.006
关键词
Rare earth alloys and compounds; Oxide materials; XPS; Synchrotron radiation; Surfaces and interfaces; LaNiO3 thin film
类别
资金
- [72/E-67/SPB/DESY/P-03/DWM 68/2004-20061]
- [G1MA-CT-2002-4017]
- [P03B 053 26]
The chemical structure and possible hydro-oxidation of LaNiO3-delta films were studied by means of tuneable high-energy X-ray photoelectron spectroscopy using synchrotron radiation. It was shown that the hydroxyl-containing phase, located near the film surface, may be attributed to the lanthanum, and nickel hydroxide species. The thickness of a hydroxide-enriched layer was estimated from the oxide/hydroxide ratio measured at normal and grazing conditions. The hydroxide layer thickness was about 2 nm for step and/or exponential hydroxide spatial distribution. (C) 2008 Elsevier Ltd. All rights reserved.
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