期刊
MICROELECTRONICS RELIABILITY
卷 52, 期 2, 页码 356-360出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.microrel.2011.06.027
关键词
-
资金
- European FP 7 project NANOPACK
- BMBF [16SV5021]
Nanoporous gold bumps have been deposited on silicon wafers by electroplating a silver-gold alloy followed by etching the silver. An open-porous cellular structure of gold at mesa-scale is left on top of the bumps. For flip chip bonding we found low temperature and low force bonding conditions. The porous interconnects have very promising properties, like compressibility and reduced stiffness, which should result in higher bond yield and extended reliability. (C) 2011 Elsevier Ltd. All rights reserved.
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