4.4 Article

Inverted nanopyramid texturing for silicon solar cells using interference lithography

期刊

MICROELECTRONIC ENGINEERING
卷 119, 期 -, 页码 146-150

出版社

ELSEVIER
DOI: 10.1016/j.mee.2014.04.004

关键词

Interference lithography; Inverted pyramid; Solar cells; Sub-wavelength texturing; Light trapping; Anti-reflection

资金

  1. FRST New Zealand

向作者/读者索取更多资源

We report on a maskless and scalable technique for fabricating nano-scale inverted pyramid structures suitable for light management in crystalline silicon solar cells. This technique utilizes interference lithography and subsequent combined dry and KOH wet pattern transfer etching techniques. The inverted nanopyramid structures suppress the total reflection at normal incidence to below 10% over the entire visible range. The overall efficiency of the solar cell has been increased by 67% with the inverted nanopyramid texturing. The standard dual MgF2/ZnS anti-reflection coating further enhanced the overall efficiency by 5.79%. (C) 2014 Elsevier BM. All rights reserved.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.4
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据