期刊
MICROELECTRONIC ENGINEERING
卷 88, 期 1, 页码 113-116出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.mee.2010.09.010
关键词
ZnO; Schottky diodes; Iridium
资金
- Center for Frontier Materials and Micro/Nano Science and Technology, National Cheng Kung University, Taiwan [D97-2700]
- Ministry of Education
- National Science Council of Taiwan [NSC 99-2218-E-150-003, NSC 99-2622-E-150-012-CC3]
Temperature-dependent characteristics of ZnO Schottky diodes with Iridium (Ir) contact electrodes were investigated. Using Norde model, it was found that the effectively Schottky barrier heights of Iron n-ZnO were around 0.837, 0.829, 0.801, 0.750 and 0.719 eV when measured at 25, 30, 50, 100 and 150 C, respectively. Using Cheung's method, it was found that Schottky barrier heights between It and the n-ZnO were 0.824, 0.823, 0.789, 0.743 and 0.740 eV when measured at 25, 30, 50, 100 and 150 C. respectively. The large Schottky barrier heights suggest that Ir is a potentially useful material for ZnO-based ultraviolet Schottky barrier photodetectors and metal semiconductor-metal photodetectors. (C) 2010 Elsevier B.V. All rights reserved.
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