4.4 Article Proceedings Paper

Selective deposition of charged nanoparticles by self-electric focusing effect

期刊

MICROELECTRONIC ENGINEERING
卷 86, 期 4-6, 页码 898-901

出版社

ELSEVIER SCIENCE BV
DOI: 10.1016/j.mee.2008.12.031

关键词

Sputtering; Charged nanoparticles; Electric focusing

向作者/读者索取更多资源

A process for the selective deposition of nanoparticles by a self-electric focusing effect is discussed. The negatively charged Nickel nanoparticles were fabricated by a DC magnetron sputtering system, and were deposited on a photoresist-patterned silicon substrate. Because of the different conductance between silicon and photoresist, the charges were accumulated on the photoresist as the nanoparticles were deposited, which caused a focusing electric field to drive the nanoparticles towards the silicon substrate. We have demonstrated that the self-focusing effect of the charged nanoparticles is responsible for increasing the density of nanoparticles in the lines patterned on silicon substrate by two orders of magnitude with respect to that on photoresist. The width of the silicon line and the width ratio between photoresist line and silicon line are the two most important parameters that will affect the self-focusing effect. (C) 2008 Elsevier B.V. All rights reserved.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.4
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据