期刊
MECHANICS OF MATERIALS
卷 42, 期 8, 页码 816-826出版社
ELSEVIER
DOI: 10.1016/j.mechmat.2010.06.002
关键词
Pb(Zr1-xTix)O-3; Epitaxial films; Misfit strain; Phase structure; Electromechanical properties
资金
- NSFC [10772155, 10732100, 10972189, 10902095]
- Provincial Natural Science Foundation of Hunan Province [07111008]
- Hunan Provincial Innovation Foundation for Postgraduate [CX2009B129]
- China Scholarship Council
- NSF [OISE-0820583]
- ARO [W911NF-07-1-0410]
It is well known that the structures and properties of ferroelectric films can be remarkably different from their bulk counterpart, and a nonlinear phenomenological theory of ferroelectrics is applied to study phase structures and electromechanical properties of epitaxial Pb(Zr1-xTix)O-3 (PZT) thin films, focusing on the effects of substrate and film thickness The effective misfit strain induced by lattice mismatch between film and substrate has been calculated, and the misfit strain-composition, temperature-composition, and thickness-composition phase diagrams of PZT films have been constructed The temperature-composition phase diagram differs substantially from that of bulk PIE ceramics, and the calculated phase structures in thin films allow us to explain numerous previous experimental observations In particular, it is confirmed that the morphotropic phase boundary (MPB) of PZT films is shifted from that of bulk PZT. resulting in substantially different electromechanical response in PIE thin films Good agreement with experimental data is observed in general. (C) 2010 Elsevier Ltd All rights reserved.
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