期刊
MEASUREMENT SCIENCE AND TECHNOLOGY
卷 21, 期 7, 页码 -出版社
IOP PUBLISHING LTD
DOI: 10.1088/0957-0233/21/7/075104
关键词
integrated circuits; RF analog circuits; low-noise amplifier; CMOS differential temperature sensors; Michelson interferometer; homodyne method; heterodyne method; analog circuits characterization; RF built-in test
资金
- Research and Information Society Department, Autonomous Government of Catalonia
- [TEC2008-01856]
This paper presents two approaches to characterize RF circuits with built-in differential temperature measurements, namely the homodyne and heterodyne methods. Both non-invasive methods are analyzed theoretically and discussed with regard to the respective trade-offs associated with practical off-chip methodologies as well as on-chip measurement scenarios. Strategies are defined to extract the center frequency and 1 dB compression point of a narrow-band LNA operating around 1 GHz. The proposed techniques are experimentally demonstrated using a compact and efficient on-chip temperature sensor for built-in test purposes that has a power consumption of 15 mu W and a layout area of 0.005 mm(2) in a 0.25 mu m CMOS technology. Validating results from off-chip interferometer-based temperature measurements and conventional electrical characterization results are compared with the on-chip measurements, showing the capability of the techniques to estimate the center frequency and 1 dB compression point of the LNA with errors of approximately 6% and 0.5 dB, respectively.
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