4.5 Article

A methodology for high resolution digital image correlation in high temperature experiments

期刊

REVIEW OF SCIENTIFIC INSTRUMENTS
卷 86, 期 3, 页码 -

出版社

AMER INST PHYSICS
DOI: 10.1063/1.4915345

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资金

  1. National Science Foundation (NSF) [DGE-1148903, CMMI-1351705]
  2. Directorate For Engineering
  3. Div Of Civil, Mechanical, & Manufact Inn [1351705] Funding Source: National Science Foundation

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We propose a methodology for performing high resolution Digital Image Correlation (DIC) analysis during high-temperature mechanical tests. Specifically, we describe a technique for producing a stable, high-quality pattern on metal surfaces along with a simple optical system that uses a visible-range camera and a long-range microscope. The results are analyzed with a high-quality open-source DIC software developed by us. Using the proposed technique, we successfully acquired high-resolution strain maps of the crack tip field in a nickel superalloy sample at 1000 degrees C. (C) 2015 AIP Publishing LLC.

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